High voltage solutions for SEM/TEM/FIB applications
Low ripple for high quality images
Advanced imaging techniques such as Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), and Focused Ion Beam (FIB), rely on precise high voltage power supplies to ensure exceptional imaging and analytical performance. High stability and ultra-low ripple voltage are critical for producing accurate, high resolution results in these demanding applications.
As manufacturers push the boundaries of technology, miniaturized and integrated solutions are essential. Compact high voltage power supplies designed for SEM, TEM and FIB systems deliver top-tier functionality, enabling high performance while maintaining a minimal footprint.
Precision solutions for SEM/TEM/FIB applications
The stability and consistency your system demands
Poor repeatability due to beam instability, low image resolution caused by high ripple, and system downtime from arcing damage can all impact the performance of SEM, TEM and FIB systems.
Our high voltage solutions offer excellent stability, ultra-low ripple down to 2 PPM, arc protection, and advanced monitoring capabilities to enable the development of high-specification microscopy tools. These features deliver more accurate, repeatable, and high resolution results for our customers.
Trusted products for SEM/TEM/FIB applications
HRF15 Series
15W module with outputs up to 15kV
0 to 100% programmable voltage and current
Line and load regulation <0.001%
Low ripple <0.001%
Stability 10ppm/hr and 25ppm/8hr
Temperature coefficient <25ppm/°C
HCP14 to HCP15K0 Series
Power output up to 15kW
Output voltages 0-3kV to 0-300kV
Positive, negative, and reversible models
Rotary dials, analog and digital interfaces
Ripple: 1ppm <50kV, 10ppm <100kV, 100ppm <300kV
Low partial discharge
HCB1.4 to HCB200 Series
Output power from 14W to 200W
Output voltages 0-1kV to 0-20kV
Bipolar reversible
4 quadrant operation with active load
Analog and digital interfaces
Short circuit and arc protection
